FIB-SEM (small)So far in 2017, Wiley has published four new Essential Knowledge Briefings (EKBs) with text written by JES Editorial.

The four EKBs are entitled: Atom Probe Tomography; Focused Ion Beam-Scanning Electron Microscopy; Correlative Microscopy in Materials Science; and Atomic Force Microscopy for Materials.

EKBs are 5000-word guides to the latest techniques, applications and equipment used in analytical science. They are written in an accessible style, modelled after feature articles in popular science magazines such as New Scientist, and can be downloaded for free at



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