Wiley has published a new Essential Knowledge Briefing (EKBs) with text written by JES Editorial. This briefing is entitled Atomic Force Microscopy for Life Sciences and is a sister title to Atomic Force Microscopy for Materials, which was published last year. Sponsored by Bruker, these two titles describe how atomic force microscopy (AFM) uses a cantilever with a sharp tip attached to the free end to detect the varying forces as the tip is scanned over a sample surface. This allows AFM not only to produce an image of the surface but also to measure various physical properties, including elasticity, stiffness and conductivity, for both biological and synthetic materials.
EKBs are 5000-word guides to the latest techniques, applications and equipment used in analytical science. They are written in an accessible style, modelled after feature articles in popular science magazines such as New Scientist, and can be downloaded for free at www.essentialknowledgebriefings.com.
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